ToF-SIMS, Time-of-Flight Secondary Ion Mass Spectroscopy for Counterfeit Detection of Electrical, Electronic, and Electromechanical (EEE) Parts

Autor:	E. Tallarek, C. Banks, M. Simard-Normandin, P.A. Clark, N. Havercroft
Rok vydání:	2019
Předmět:	Materials science Time of flight secondary ion mass spectroscopy Analytical chemistry Counterfeit
Zdroj:	International Symposium for Testing and Failure Analysis.
ISSN:	0890-1740
DOI:	10.31399/asm.cp.istfa2019p0053
Popis:	This presentation demonstrates how Time-of-Flight Secondary Ion Mass Spectroscopy provides unique information to identify suspect counterfeit semiconductor devices. An example is shown where the epitaxial layers of a light emitting device (LED) do not match those of the exemplar. Keywords: Secondary Ion Mass Spectroscopy, SIMS, counterfeit detection, LED, Light emitting diode.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f4bddba9e73266dc7ce3be14435c50d9 https://doi.org/10.31399/asm.cp.istfa2019p0053 Zobrazit plný text záznamu