Field-Effect Transistors as THz radiation detectors

Autor:	D. Tomaszewski, M. Zaborowski, J. Marczewski, K. Kucharski, P. Bajurko
Rok vydání:	2022
Zdroj:	2022 IEEE Latin American Electron Devices Conference (LAEDC).
DOI:	10.1109/laedc54796.2022.9908179
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f4a8d5c9920cb1a0ec500da5240265ad https://doi.org/10.1109/laedc54796.2022.9908179 Zobrazit plný text záznamu