The Effect of Ionization Damage on Displacement Damage in AlGaN/GaN HEMTs

Autor:	Pengfei Wan, Jianqun Yang, Hao Jiang, Yuanting Huang, Ling Lv, Lei Dong, Xiaoqing Yue, Bin Zhang, Gang Lin, Guojian Shao, Weiqi Li, Xiaodong Xu, Xiuhai Cui, Xingji Li
Rok vydání:	2022
Předmět:	Nuclear and High Energy Physics Nuclear Energy and Engineering Electrical and Electronic Engineering
Zdroj:	IEEE Transactions on Nuclear Science. 69:2129-2135
ISSN:	1558-1578 0018-9499
DOI:	10.1109/tns.2022.3199269
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f4930ce616bd1f42071e77422d291878 https://doi.org/10.1109/tns.2022.3199269 Zobrazit plný text záznamu