Two Multiport De-Embedding Methods for Accurate On-Wafer Characterization of 60-GHz Differential Amplifiers
| Autor: | Edwin van der Heijden, Ralf M T Pijper, Luuk F Tiemeijer |
|---|---|
| Rok vydání: | 2011 |
| Předmět: |
Engineering
Radiation business.industry Differential amplifier Integrated circuit Condensed Matter Physics Capacitance law.invention Inductance law Hardware_INTEGRATEDCIRCUITS Electronic engineering Embedding Wafer Parasitic extraction Electrical and Electronic Engineering business Electrical impedance |
| Zdroj: | IEEE Transactions on Microwave Theory and Techniques. 59:763-771 |
| ISSN: | 1557-9670 0018-9480 |
| DOI: | 10.1109/tmtt.2010.2095879 |
| Popis: | Two algorithms for distributed open-short (OS) and open-short-load de-embedding of multiport on-wafer S -parameter measurements are presented, and used for the characterization of four-port differential amplifiers operating in the 60-GHz band. For both methods, comparison to industry standard OS de-embedding shows that anomalies in extracted test-structure parasitics are now avoided, which in particular improves the characterization of the differential input and output impedances. |
| Databáze: | OpenAIRE |
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