Detectability of Open Defects at Interconnects between Dies in 3D Stacked ICs with Relaxation Oscillators
| Autor: | Masao Ohmatsu, Fumiya Sako, Yuki Ikiri, Hiroyuku Yotsuyanagi, Shyue-Kung Lu, Masaki Hashizume |
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| Rok vydání: | 2022 |
| Zdroj: | 2022 IEEE CPMT Symposium Japan (ICSJ). |
| Databáze: | OpenAIRE |
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