Determination of the optical dielectric functions of thin absorbing films from IR reflectivity measurements
| Autor: | Y.T. Chu |
|---|---|
| Rok vydání: | 1993 |
| Předmět: |
Aluminium oxides
Chemistry business.industry Metals and Alloys Infrared spectroscopy Surfaces and Interfaces Substrate (electronics) Dielectric Reflectivity Spectral line Surfaces Coatings and Films Electronic Optical and Magnetic Materials Optics Materials Chemistry Dielectric function Thin film business |
| Zdroj: | Thin Solid Films. 229:119-121 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/0040-6090(93)90418-o |
| Popis: | A method of determining the optical dielectric function of an absorbing thin film overlayed on an absorbing thick substrate by a classical oscillator fit to its experimental IR reflectivity spectra is reported. This simple method overcomes the difficulty that occurs in identifying those modes of the film with large damping. Using this method the optical dielectric function of a γ-Al 2 O 3 thin film overlayed on a single-crystal α-Al 2 O 3 substrate is determined. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|