Uncertainty evaluation and electronic improvements of a wavemeter to measure the wavelength of an external cavity diode laser

Autor:	Ismael Outumuro, Benito V. Dorrío, J. Blanco, J. L. Valencia, J. Diz-Bugarin
Rok vydání:	2015
Předmět:	Physics History Vernier scale business.industry Laser Computer Science Applications Education law.invention Interferometry Microcontroller Wavelength Optics law Calibration Gauge block business Diode
Zdroj:	Journal of Physics: Conference Series. 605:012018
ISSN:	1742-6596 1742-6588
DOI:	10.1088/1742-6596/605/1/012018
Popis:	A Michelson wavemeter was developed to test the accuracy and give traceability to the wavelength of external cavity diode lasers. These lasers were stabilized using a Littrow configuration and an iodine gas cell as frequency reference, and they were used as light sources in the assembly of a new interferometric system for the gauge block calibration. Previously, a microcontroller counting device with a Vernier logic and the uncertainty evaluation of the Michelson wavemeter had to be made.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f410e5311dcc2772b5e4d4d4e37e22de https://doi.org/10.1088/1742-6596/605/1/012018 Zobrazit plný text záznamu