Spectral characterization of SPDC-based single-photon sources for quantum key distribution
| Autor: | Daniel Hofmann, Sabine Euler, Erik Fitzke, Till Dolejsky, Oleg Nikiforov, Thomas Walther |
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| Rok vydání: | 2021 |
| Předmět: |
Physics
Spectrum analyzer Photon business.industry Physics::Optics General Physics and Astronomy 02 engineering and technology Quantum key distribution 021001 nanoscience & nanotechnology 01 natural sciences Spectral line law.invention 010309 optics Superposition principle Optics law 0103 physical sciences General Materials Science Physical and Theoretical Chemistry 0210 nano-technology business Second source Waveguide Parametric statistics |
| Zdroj: | The European Physical Journal Special Topics. 230:1073-1080 |
| ISSN: | 1951-6401 1951-6355 |
| DOI: | 10.1140/epjs/s11734-021-00081-5 |
| Popis: | In our laboratory, we employ two biphoton sources for quantum key distribution. The first is based on cw parametric down-conversion of photons at 404 nm in PPKTP waveguide chips, while the second is based on the pulsed parametric down-conversion of 775 nm photons in PPLN waveguides. The spectral characterization is important for the determination of certain side-channel attacks. A Hong-Ou-Mandel experiment employing the first photon source revealed a complex structure of the common Hong-Ou-Mandel dip. By measuring the spectra of the single photons at 808 nm, we were able to associate these structures to the superposition of different transverse modes of the pump photons in our waveguide chips. The pulsed source was characterized by means of single-photon spectra measured by a sensitive spectrum analyzer as well as dispersion-based measurements. Finally, we also describe Hong-Ou-Mandel experiments using the photons from the second source. |
| Databáze: | OpenAIRE |
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