The Impact of Logic Gates Susceptibility in Overall Circuit Reliability Analysis

Autor:	Matheus F. Pontes, Ingrid F. V. Oliveira, Rafael B. Schvittz, Leomar S. Rosa, Paulo F. Butzen
Rok vydání:	2022
Zdroj:	2022 IEEE International Symposium on Circuits and Systems (ISCAS).
DOI:	10.1109/iscas48785.2022.9937573
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f3e8cd72bbdea12650f7fc640c81685d https://doi.org/10.1109/iscas48785.2022.9937573 Zobrazit plný text záznamu