Spatial mapping of cadmium zinc telluride materials properties and electrical response to improve device yield and performance

Autor:	Ralph B. James, Nathan R. Hilton, J.C. Lund, T. S. Gilbert, J. M. Van Scyoc, H. Yoon, B. A. Brunett
Rok vydání:	1999
Předmět:	Physics Nuclear and High Energy Physics Fabrication Yield (engineering) business.industry Detector Spatial mapping Characterization (materials science) Cadmium zinc telluride chemistry.chemical_compound chemistry Optoelectronics business Instrumentation
Zdroj:	Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 428:1-7
ISSN:	0168-9002
DOI:	10.1016/s0168-9002(98)01573-3
Popis:	Cadmium zinc telluride has experienced tremendous growth in its application to various radiation sensing problems over the last five years. However, there are still issues with yield, particularly of the large volume devices needed for imaging and sensitivity-critical applications. Inhomogeneities of various types and on various length scales currently prevent the fabrication of large devices of high spectral performance. This paper discusses the development of a set of characterization tools for quantifying these inhomogeneities, in order to develop improvement strategies to achieve the desired cadmium zinc telluride crystals for detector fabrication.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f3e6e65d21833d7c118362b87a2529fb https://doi.org/10.1016/s0168-9002(98)01573-3 Zobrazit plný text záznamu Full Text from ScienceDirect