Examples of Analysis from an Integrated X-Ray Fluorescence Analysis System Using NRLXRF
| Autor: | M. J. Rokosz, B. E. Artz |
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| Rok vydání: | 1981 |
| Předmět: | |
| Zdroj: | Advances in X-ray Analysis. 25:81-84 |
| ISSN: | 2631-3626 0376-0308 |
| DOI: | 10.1154/s0376030800009551 |
| Popis: | Methods of correction for matrix differences are required in X-ray Fluorescence (XRF) Analysis when the overall composition of the unknowns is substantially different from the available standards. Sample preparation techniques used to minimize matrix differences often require development time and can consume irreplaceable sample material. Alternatively, the increasing computer power available to the analyst and the refinement of computer programs using fundamental parameter calculations has made this approach more attractive.A system-consisting of a Siemens SRS-1 wavelength dispersive spectrometer (WDS), a KEVEX 0810-A/NS880 energy dispersive spectrometer (EDS), software for data collection and manipulation and a 40 element version of the NRLXRF fundamental-parameters analysis program has been put together to simplify XRF analysis of samples lacking standards of a similar composition. This configuration is shown schematically in Figure I. |
| Databáze: | OpenAIRE |
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