Experimental Demonstration of Double Moiré Structured Illumination Microscopy
| Autor: | Doron Shterman, Bergin Gjonaj, Guy Bartal |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Materials science
business.industry Resolution (electron density) Structured illumination microscopy 02 engineering and technology Moiré pattern 021001 nanoscience & nanotechnology 01 natural sciences 010309 optics Optics 0103 physical sciences Microscopy Spatial frequency 0210 nano-technology business Optical filter Image resolution Laser beams |
| Zdroj: | Conference on Lasers and Electro-Optics. |
| Popis: | ∼ 4 fold resolution enhancement is demonstrated experimentally, with respect to a low NA capabilities, utilizing a novel Double Moire Structured Illumination Microscopy (DM-SIM) scheme. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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