In-situ ellipsometry studies of adsorption of Hg on CdTe(211)B/Si(211) and molecular beam epitaxy growth of HgCdTe(211)B
| Autor: | G. Badano, James W. Garland, Yong Chang, S. Sivananthan |
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| Rok vydání: | 2004 |
| Předmět: |
Reflection high-energy electron diffraction
Chemistry Nucleation Analytical chemistry Surface finish Substrate (electronics) Condensed Matter Physics Cadmium telluride photovoltaics Electronic Optical and Magnetic Materials Adsorption Ellipsometry Materials Chemistry Electrical and Electronic Engineering Molecular beam epitaxy |
| Zdroj: | Journal of Electronic Materials. 33:583-589 |
| ISSN: | 1543-186X 0361-5235 |
| Popis: | We study the adsorption of Hg on CdTe(211)B using an 88-wavelength spectroscopic ellipsometer mounted on a commercial, molecular beam epitaxy (MBE) chamber. A detailed analysis of the pseudo-dielectric function shows that Hg is present at the surface both in chemisorbed and physisorbed form. Effective medium models for a mixture of chemisorbed and physisorbed Hg on the microscopically rough CdTe surface could not fit our data. However, a proposed model in which a partial layer of physisorbed Hg sits on top of a partial layer of chemisorbed Hg fits the measured pseudo-dielectric function well and yields precise values for the thicknesses of the chemisorbed and the physisorbed Hg layers. These values change in the expected manner as a function of Hg flux, temperature, and Te coverage. An analysis of the uncertainty in the measured thicknesses is carried out in detail, and a study of the limitations of the ellipsometer used for this study is presented. The effects of these limitations on the precision and accuracy of in-situ data are enumerated. |
| Databáze: | OpenAIRE |
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