Demonstration of SiC Pressure Sensors at 750 °C

Autor: Robert S. Okojie, Dorothy Lukco, Ender Savrun, Vu Nguyen
Rok vydání: 2014
Předmět:
Zdroj: Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT). 2014:000028-000032
ISSN: 2380-4491
DOI: 10.4071/hitec-ta21
Popis: We report the first demonstration of MEMS-based 4H-SiC piezoresistive pressure sensors tested at 750 °C and in the process confirmed the existence of strain sensitivity recovery with increasing temperature above 400 °C, eventually achieving near or up to 100 % of the room temperature values at 750 °C. This strain sensitivity recovery phenomenon in 4H-SiC is uncharacteristic of the well-known monotonic decrease in strain sensitivity with increasing temperature in silicon piezoresistors. For the three sensors tested, the room temperature full-scale output (FSO) at 200 psig ranged between 29 and 36 mV. Although the FSO at 400 °C dropped by about 60 %, full recovery was achieved at 750 °C. This result will allow the operation of SiC pressure sensors at higher temperatures, thereby permitting deeper insertion into the engine combustion chamber to improve the accurate quantification of combustor dynamics.
Databáze: OpenAIRE