Phase Contrast in Electron Microscope Images
| Autor: | E. G. Ramberg |
|---|---|
| Rok vydání: | 1949 |
| Předmět: |
Materials science
Contrast transfer function business.industry Scattering media_common.quotation_subject Phase (waves) General Physics and Astronomy law.invention Optics law Contrast (vision) sense organs Electron microscope Thin film business Absorption (electromagnetic radiation) High-resolution transmission electron microscopy media_common |
| Zdroj: | Journal of Applied Physics. 20:441-444 |
| ISSN: | 1089-7550 0021-8979 |
| DOI: | 10.1063/1.1698403 |
| Popis: | Image contrast in electron microscope images may arise from absorption, scattering, or phase changes impressed on the illuminating electron wave. In the present paper the intensity distribution in the in‐focus and out‐of‐focus image of an edge of a transparent thin film introducing a prescribed phase change in the incident beam is calculated. It is found that the resulting ``phase contrast'' increases both with the film thickness (i.e., magnitude of phase change) and with the degree of defocusing and, for thin specimens, exceeds other sources of contrast in magnitude. The model is too schematic to permit a quantitative comparison with measured intensity distributions. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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