| Autor: |
Wolfram Wersing, Bohuslav Rezek, E. Hartmann, Peter Radojkovic, Frederick Koch, Christian Erich Zybill, Michael Schwartzkopff, Rainer Bruchhaus, Hussein Boubekeur, Gerhard Groos |
| Rok vydání: |
1999 |
| Předmět: |
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| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.352816 |
| Popis: |
Domain wall sin ferroelectric tetragonal poled PZT films have been observed by surface corrugation effects. Boundaries between adjacent 90 degree domains show a vertical shrinkage on the surface as result of coherency defects and shear strain at the interface between domains. The vertical truncation of the surface amounts to 1.0-1.5 nm. The wall thickness of 90 degree domains has been estimated to approximately 1 nm. STM allows to detect domains after metallization of the surface with a Cr-Ni or Ti film. AFM measurements with grounded samples provide a detailed picture of the unmetallized PZT surface. Single crystalline areas consists of strictly oriented domains of 10-15 nm width. Domains show long-range ordering effects due to stress in the film. A mean value of domain width can also be obtained by SAXS and amounts to 17.5 nm. Exertion of stress result into an increase of domain thickness by approximately 1 percent. Electrical switching of single crystallites as well as optical effects have been demonstrated. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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