| Autor: |
R.F. Garrett, H. Moulin, F.A. Dilmanian, Dean Chapman, D.P. Siddons, Jerome B. Hastings, E. Nachaliel |
| Rok vydání: |
1992 |
| Předmět: |
|
| Zdroj: |
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 319:149-154 |
| ISSN: |
0168-9002 |
| DOI: |
10.1016/0168-9002(92)90546-g |
| Popis: |
Measurements done recently at the NSLS have indicated that the level of intensity found in the wings of diffraction peaks from silicon at higher X-ray energies (> 20 keV) far exceeds the value which would be predicted based on the dynamical theory. We have measured Si(220) double crystal rocking curves at the 40 keV fundamental and harmonics with various crystal scattering geometries: Bragg-Bragg, Laue-Bragg, Laue-Laue. The comparison of the Bragg and Laue case diffraction geometries was done to determine scattering volume effects. Comparisons with dynamical theory calculations will be discussed. These measurements have been carried out in order to assess the level of harmonic contamination which will be present from a double crystal monochromator being designed for the X17 superconducting wiggler beamline. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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