Polariton linewidths in a semiconductor microcavity
| Autor: | Ph. Roussignol, F.F Charfi, R Chtourou, M Maghrebi, V. Thierry-Mieg, Claude Delalande, Jérôme Tignon, Jacqueline Bloch |
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| Rok vydání: | 2002 |
| Předmět: |
Condensed Matter::Quantum Gases
Materials science Condensed matter physics Condensed Matter::Other business.industry Exciton Physics::Optics Semiclassical physics Bioengineering Linear dispersion Reflectivity Spectral line Biomaterials Laser linewidth Semiconductor Mechanics of Materials Polariton Physics::Atomic Physics business |
| Zdroj: | Materials Science and Engineering: C. 21:223-226 |
| ISSN: | 0928-4931 |
| DOI: | 10.1016/s0928-4931(02)00093-0 |
| Popis: | The linewidths of microcavity polariton modes are measured form reflectivity spectra at 10 K as a function of the detuning between exciton and cavity modes. The narrowing of the polariton features is described in the framework of the semiclassical approach of linear dispersion theory including exciton asymmetric inhomogenous broadening. We have also measured the polariton linewidth for different sample temperatures and observed the same polariton linewidth behaviour as that for homogenous broadening system. |
| Databáze: | OpenAIRE |
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