A Novel Automated Approach to Serial Block Face DualBeam Electron Microscopy for the Exploration of Cortical Circuits

Autor:	H Mulders, S Reyntjens, B Lich, Graham Knott, D Wall, Dmitri B. Chklovskii
Rok vydání:	2006
Předmět:	Cortical circuits Materials science law Block face Nanotechnology Electron microscope Instrumentation law.invention
Zdroj:	Microscopy and Microanalysis. 12:1236-1237
ISSN:	1435-8115 1431-9276
Popis:	Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f1e2b9d81fde847d3c53e574719f5cb5 https://doi.org/10.1017/s1431927606065275 Zobrazit plný text záznamu