Automatic analysis of Rutherford backscattering spectrometry spectra

Autor: K.A. Meyer, V.M. Prozesky, J. Padayachee
Rok vydání: 2001
Předmět:
Zdroj: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 181:122-127
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(01)00537-7
Popis: It has been shown that Bayesian statistics is a powerful tool in the analysis of ion beam analysis (IBA) data. Past work has shown its applicability to the deconvolution of the detector response function from micro-Rutherford backscattering spectrometry (RBS) and micro-proton-induced X-ray emission (PIXE) spectra, subtraction of the background from PIXE spectra, the extraction of depth profiles from PIXE spectra using two detectors and the extraction of depth profiles from RBS spectra. However, the method has some drawbacks, e.g. numerical integration, α-marginalisation, etc., all of which result in very long computation times. In this paper, preliminary results are presented from the application of the Bayesian theory to the automatic extraction of depth profiles from RBS spectra with the aim of creating an online RBS analysis program, which has the advantage of minimal user input while still being as computationally intensive as conventional RBS analysis packages to extract a depth profile.
Databáze: OpenAIRE