Electron microscopy study of chemically deposited Ni-P films

Autor:	S. V. S. Tyagi, S Ray, V. K. Tandon
Rok vydání:	1986
Předmět:	Materials science Nucleation Microstructure law.invention Amorphous solid Crystallography Microcrystalline Mechanics of Materials law General Materials Science Thin film Electron microscope Selected area diffraction Solid solution
Zdroj:	Bulletin of Materials Science. 8:433-438
ISSN:	0973-7669 0250-4707
DOI:	10.1007/bf02744158
Popis:	The structure of electroless thin films of Ni-P has been studied. The microstructure and the selected area diffraction pattern of the samples reveal that certain samples transform to crystalline Ni with P in solid solution by nucleation and growth, whereas others transform to crystalline state by growth alone. The former set of thin films having a P-content of 19–21 at.% is characterized as amorphous. Films with a P-content of 13–15 at.% fall in the latter category and are characterized as microcrystalline. Those with a P-content of 16–18 at.% contain both amorphous and microcrystalline regions.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f1df5799727d5b0980b8c76e13282655 https://doi.org/10.1007/bf02744158 Zobrazit plný text záznamu Full text from SpringerLink