Degradation Mechanism Of Electron Emission Characteristics In Silicon Field Emitters

Autor:	Yong-Min Kim, Hyung Joun Yoo, Byung Sung O, Yoon-Ho Song, Kyoung Ik Cho, Jin Ho Lee
Rok vydání:	1997
Předmět:	Fabrication Materials science Field (physics) Silicon chemistry business.industry Etching (microfabrication) Optoelectronics chemistry.chemical_element Degradation (geology) Electron business
Zdroj:	Proceedings of the Fourth Asian Symposium on Information Display.
DOI:	10.1109/asid.1997.631439
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f1d74a091255fac700ef5339fed21f9e https://doi.org/10.1109/asid.1997.631439 Zobrazit plný text záznamu