Optical Characterization of High Refractive Index Glass Wafers for Augmented Reality Wearables

Autor:	Jue Wang, Thomas J. Dunn, Michael A. Kapusta, Nicholas M. Walker, Deanna A. Moschitta, Christopher Alan Lee, Karl W. Koch, Jean Francois Oudard, Michael J. Cangemi, Alex Bean, Michael John Moore
Rok vydání:	2019
Předmět:	Optics Materials science High-refractive-index polymer business.industry Laser cutting Wearable computer Augmented reality Wafer business Refractive index Optical depth Characterization (materials science)
Zdroj:	Optical Interference Coatings Conference (OIC) 2019.
Popis:	Refractive index and optical thickness homogeneities of 99.979% and 99.984% were determined by using wafer-size metrologies. SiO2 & Nb2O5 based low loss anti-reflective coatings in the visible were realized for augmented reality wearables.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f1c571f829bbf06b28ba4115adf677db https://doi.org/10.1364/oic.2019.thc.3 Zobrazit plný text záznamu