Surface damage metrology: precision at low cost

Autor: Lionel R. Baker
Rok vydání: 2002
Předmět:
Zdroj: SPIE Proceedings.
ISSN: 0277-786X
Popis: This paper reviews the current status of methods for the inspection and measurement of damage, such as digs and scratches on high quality surfaces and reports on relevant ISO standards. A simple but precise low-cost approach for measuring imperfections and contamination on and within an optical system using a digital camera is described.
Databáze: OpenAIRE