Surface damage metrology: precision at low cost
Autor: | Lionel R. Baker |
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Rok vydání: | 2002 |
Předmět: | |
Zdroj: | SPIE Proceedings. |
ISSN: | 0277-786X |
Popis: | This paper reviews the current status of methods for the inspection and measurement of damage, such as digs and scratches on high quality surfaces and reports on relevant ISO standards. A simple but precise low-cost approach for measuring imperfections and contamination on and within an optical system using a digital camera is described. |
Databáze: | OpenAIRE |
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