Electrical and structural characterisation of single ZnO nanorods
| Autor: | E. Schlenker, A. C. Mofor, Peter Hinze, Arne Behrends, Andreas Waag, Andrey Bakin, Th. Weimann |
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| Rok vydání: | 2008 |
| Předmět: |
Materials science
Nanowire Analytical chemistry chemistry.chemical_element Zinc Condensed Matter Physics Electromigration Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials chemistry Chemical engineering Electrode Nanorod Electrical and Electronic Engineering Layer (electronics) Lithography Electron-beam lithography |
| Zdroj: | Microelectronic Engineering. 85:1248-1252 |
| ISSN: | 0167-9317 |
| Popis: | Zinc oxide (ZnO) nanorods grown by vapor transport were contacted individually with Ti/Au electrodes structured by e-beam lithography. The rectifying behaviour observed in the current-voltage characteristics is likely caused by an interfacial insulating layer between the ZnO nanowires and the contact material. Energy-dispersive X-ray spectroscopy (EDX) measurements performed on electrically measured and non measured reference nanowires reveal that no electromigration of Au or Ti into the nanowires occurs. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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