Towards theoretical analysis of optoelectronic performance of uniform and random metallic nanowire layers
| Autor: | Aliaksandr Hubarevich, Yauhen Mukha, Mikita Marus, A. Smirnov, Weijun Fan, Hong Wang, Haoliang Huang, Xiao Wei Sun |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
Materials science
Nanowire chemistry.chemical_element 02 engineering and technology 01 natural sciences Metal Aluminium 0103 physical sciences Materials Chemistry Transmittance Electrical conductor Sheet resistance Diode 010302 applied physics business.industry Metals and Alloys Surfaces and Interfaces 021001 nanoscience & nanotechnology Surfaces Coatings and Films Electronic Optical and Magnetic Materials chemistry visual_art visual_art.visual_art_medium Optoelectronics 0210 nano-technology business Visible spectrum |
| Zdroj: | Thin Solid Films. 626:140-144 |
| ISSN: | 0040-6090 |
| Popis: | This work presents a theoretical analysis of optical and electronic properties of uniform and random silver (Ag) and aluminum (Al) nanowire (NW) layers. At low concentrations of NWs the uniform and random layers possess similar average transmittance in the visible spectrum. However, at high concentrations of NWs the random Ag and Al layers demonstrate up to 38% and 45% average transmittance, respectively. Moreover, at high concentrations of NWs the uniform and random Ag layers outperform identical Al layers up to 15% and 5% average transmittance, respectively. Our results indicate that metallic random NW transparent conductive layers benefit in optoelectronic devices demanding lowest sheet resistance, such as solar cells and light-emitting diodes. |
| Databáze: | OpenAIRE |
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