Relation between robustness against ESD and against flash events in deflection amplifiers
| Autor: | P. van Oosten, J. Voets, Adrianus Willem Ludikhuize, R. van Roijen |
|---|---|
| Rok vydání: | 2000 |
| Předmět: |
Engineering
Electrostatic discharge business.industry Amplifier Vertical deflection Hardware_PERFORMANCEANDRELIABILITY Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Deflection (engineering) Robustness (computer science) Hardware_INTEGRATEDCIRCUITS Electronic engineering Electrical and Electronic Engineering Safety Risk Reliability and Quality business Hardware_LOGICDESIGN |
| Zdroj: | Microelectronics Reliability. 40:1263-1266 |
| ISSN: | 0026-2714 |
| Popis: | We have investigated the relation between the electrostatic discharge (ESD) level achieved by vertical deflection amplifiers, used for television sets, and other discharge events affecting the reliability. In particular, it is known that the tubes of television sets sometimes produce so called flashes, which may damage the amplifiers. It is generally assumed that good ESD robustness corresponds to robustness against flash. However, we show that improving ESD performance can sometimes be detrimental to robustness against flash. We discuss the mechanism underlying these seemingly conflicting results and describe a method of improving ESD, while simultaneously enhancing flash robustness. |
| Databáze: | OpenAIRE |
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