Stress–corrosion cracking of indium tin oxide coated polyethylene terephthalate for flexible optoelectronic devices
| Autor: | Karpagavalli Ramji, Konstantinos A. Sierros, Darran R. Cairns, Nicholas J. Morris |
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| Rok vydání: | 2009 |
| Předmět: |
Materials science
Environmental stress cracking business.industry fungi Delamination Metals and Alloys food and beverages Surfaces and Interfaces Surfaces Coatings and Films Electronic Optical and Magnetic Materials Corrosion Indium tin oxide Stress (mechanics) chemistry.chemical_compound chemistry Materials Chemistry Polyethylene terephthalate Optoelectronics Stress corrosion cracking Composite material business Layer (electronics) |
| Zdroj: | Thin Solid Films. 517:2590-2595 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/j.tsf.2008.10.031 |
| Popis: | Stress corrosion cracking of transparent conductive layers of indium tin oxide (ITO), sputtered on polyethylene terephthalate (PET) substrates, is an issue of paramount importance in flexible optoelectronic devices. These components, when used in flexible device stacks, can be in contact with acid containing pressure-sensitive adhesives or with conductive polymers doped in acids. Acids can corrode the brittle ITO layer, stress can cause cracking and delamination, and stress–corrosion cracking can cause more rapid failure than corrosion alone. The combined effect of an externally-applied mechanical stress to bend the device and the corrosive environment provided by the acid is investigated in this work. We show that acrylic acid which is contained in many pressure-sensitive adhesives can cause corrosion of ITO coatings on PET. We also investigate and report on the combined effect of external mechanical stress and corrosion on ITO-coated PET composite films. Also, it is shown that the combination of stress and corrosion by acrylic acid can cause ITO cracking to occur at stresses less than a quarter of those needed for failure with no corrosion. In addition, the time to failure, under ~ 1% tensile strain can reduce the total time to failure by as much as a third. |
| Databáze: | OpenAIRE |
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