Effect of Negative Back Bias on FD-SOI Device Parameters down to Cryogenic Temperature
| Autor: | Anuj Bhardwaj, Sujit. K. Singh, Anand Mishra, David Petit, Francois Paolini, Abhisek Dixit |
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| Rok vydání: | 2022 |
| Zdroj: | 2022 IEEE Latin American Electron Devices Conference (LAEDC). |
| DOI: | 10.1109/laedc54796.2022.9908200 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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