Determination of size, shape and composition of buried InAs/GaAs quantum dots: scanning transmission electron microscopy vs. in-plane X-ray scattering

Autor:	P. F. Fewster, Tim Jones, B. A. Joyce, D Zhi, D.W. Pashley, Peter Goodhew
Rok vydání:	2018
Předmět:	In plane Optics Materials science business.industry Scattering Quantum dot Scanning transmission electron microscopy X-ray Optoelectronics Composition (combinatorics) business
Zdroj:	Microscopy of Semiconducting Materials 2003 ISBN: 9781351074636
DOI:	10.1201/9781351074636-20
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f13bbc55c3abbfaaf985a1eebb13afcf https://doi.org/10.1201/9781351074636-20 Zobrazit plný text záznamu