An Expert Survey for Developing the Pattern Diagnosis Instrument of Acne

Autor:	Woo-Yeol Jeong, Junhee Lee, Jun-Hyuk Shin, Hae-Jung Nam, Young-Kyun Moon, Yoon-Bum Kim, Kyuseok Kim
Rok vydání:	2015
Předmět:	medicine.medical_specialty business.industry medicine medicine.disease business Dermatology Acne
Zdroj:	The Journal of Korean Medicine Ophthalmology and Otolaryngology and Dermatology. 28:23-32
ISSN:	1738-6640
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f1333941159f561bdcc1e6b95143b9e8 https://doi.org/10.6114/jkood.2015.28.2.023 Zobrazit plný text záznamu