Scalability of Capacitive Hardening for Flip-Flops in Advanced Technology Nodes
| Autor: | Trey Reece, Z. J. Diggins, Lloyd W. Massengill, Rick Wong, N. N. Mahatme, T. D. Loveless, N. J. Gaspard, A. F. Witulski, S.-J. Wen, S. Jagannathan, Bharat L. Bhuva |
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| Rok vydání: | 2013 |
| Předmět: |
Nuclear and High Energy Physics
Materials science business.industry Capacitive sensing Electrical engineering chemistry.chemical_element Alpha particle Capacitance Xenon Nuclear Energy and Engineering chemistry Hardening (metallurgy) Optoelectronics Neutron Electrical and Electronic Engineering business Radiation hardening Pulse-width modulation |
| Zdroj: | IEEE Transactions on Nuclear Science. 60:4394-4398 |
| ISSN: | 1558-1578 0018-9499 |
| DOI: | 10.1109/tns.2013.2286272 |
| Popis: | Capacitive radiation hardening by design (RHBD) techniques to reduce the single-event cross section of flip-flops are shown to be effective at highly scaled technology nodes, especially for the terrestrial environment. Test results for different values of RHBD capacitance for both 40 nm and 28 nm technology node designs show that small values of RHBD capacitance ( |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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