X-ray photoelectron spectroscopy for surface film analysis in corrosion research

Autor:	P K Chauhan, R Krishnan, H S Gadiyar
Rok vydání:	1985
Předmět:	Materials science Valence (chemistry) Passivation Chemical engineering X-ray photoelectron spectroscopy Galvanic anode Elemental distribution General Physics and Astronomy Chemical composition Surface film Corrosion
Zdroj:	Pramana. 24:383-395
ISSN:	0973-7111 0304-4289
Popis:	Surface films on metals and alloys often protect them from reaction with the environment, and hence a knowledge of their protective properties and composition could be invaluable for predicting their corrosion behaviour. XPS (x-ray photoelectron spectroscopy) could provide a quantitative analysis of the chemical composition, the nature of valence states and elemental distribution within the surface films.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f070f89ebd08a416f16673961c1c2a9d https://doi.org/10.1007/bf02894840 Zobrazit plný text záznamu Full text from SpringerLink