Electron backscatter diffraction of Nb3Sn coated niobium: Revealing structure as a function of depth
| Autor: | Michael J. Kelley, C. E. Reece, Jonathan Angle, Grigory Eremeev, Fred A. Stevie, Jay Tuggle, Uttar Pudasaini |
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| Rok vydání: | 2019 |
| Předmět: |
010302 applied physics
Materials science business.industry Process Chemistry and Technology Niobium chemistry.chemical_element 02 engineering and technology Function (mathematics) 021001 nanoscience & nanotechnology 01 natural sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials Characterization (materials science) Optics chemistry Electron diffraction 0103 physical sciences Materials Chemistry Sample preparation Specimen preparation Electrical and Electronic Engineering 0210 nano-technology business Instrumentation Electron backscatter diffraction |
| Zdroj: | Journal of Vacuum Science & Technology B. 37:052901 |
| ISSN: | 2166-2754 2166-2746 |
| DOI: | 10.1116/1.5096338 |
| Popis: | Over the last two decades, advances in Electron Backscatter Diffraction (EBSD) have moved the technique from a research tool to an essential characterization technique in many fields of material research. EBSD is the best suited technique for determining structure as a function of depth. This characterization is critically important but has been previously absent from Nb3Sn efforts. While EBSD is the technique of choice, obtaining quality data can be difficult. Sample preparation in particular is nontrivial. Here, we summarize the general principles of EBSD, discuss specific sample preparation techniques for Nb3Sn coated SRF cavity materials, and give examples of how EBSD is being used to understand fundamental growth mechanisms for Nb3Sn coatings.Over the last two decades, advances in Electron Backscatter Diffraction (EBSD) have moved the technique from a research tool to an essential characterization technique in many fields of material research. EBSD is the best suited technique for determining structure as a function of depth. This characterization is critically important but has been previously absent from Nb3Sn efforts. While EBSD is the technique of choice, obtaining quality data can be difficult. Sample preparation in particular is nontrivial. Here, we summarize the general principles of EBSD, discuss specific sample preparation techniques for Nb3Sn coated SRF cavity materials, and give examples of how EBSD is being used to understand fundamental growth mechanisms for Nb3Sn coatings. |
| Databáze: | OpenAIRE |
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