Wavefront-flatness evaluation by wavefront-correlation-information-entropy method and its application for adaptive confocal microscope
| Autor: | Yoshiaki Yasuno, Tobias Wiesendanger, Toyohiko Yatagai, Shuichi Makita, Aiko Ruprecht, Hans J. Tiziani |
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| Rok vydání: | 2004 |
| Předmět: |
Wavefront
Signal processing Microscope business.industry Computer science Confocal Flatness (systems theory) Fourier optics Astrophysics::Instrumentation and Methods for Astrophysics Physics::Optics Membrane mirror Physical optics Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention Lens (optics) Optics law Confocal microscopy Electrical and Electronic Engineering Physical and Theoretical Chemistry business |
| Zdroj: | Optics Communications. 232:91-97 |
| ISSN: | 0030-4018 |
| Popis: | A simple wavefront evaluation method is proposed which employs only one Fourier transform lens, one CCD camera and a digital signal processing procedure. The optical setup is sufficiently simple to be used in numerous types of optical systems. The feasibility of the method is demonstrated in an adaptive confocal microscope which dynamically corrects aberrations. This confocal microscope contains a deformable membrane mirror whose shape is optimized using a genetic algorithm and a wavefront evaluation method. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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