Magnetic force microscopy of ferromagnetic nanoparticles formed in Al2O3 and SiO2 by ion implantation

Autor:	C. W. White, Lynn A. Boatner, K.S. Beaty, Al Meldrum, S. P. Withrow, John D. Budai, K. D. Sorge, C. E. Vallet, James R. Thompson
Rok vydání:	2002
Předmět:	Materials science Magnetism business.industry General Physics and Astronomy Nanoparticle equipment and supplies Ion Nuclear magnetic resonance Ion implantation Ferromagnetism Transmission electron microscopy Optoelectronics Magnetic nanoparticles Magnetic force microscope business human activities
Zdroj:	Journal of Applied Physics. 92:6200-6204
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.1512693
Popis:	Magnetic force microscopy (MFM) has been used to investigate the properties of ferromagnetic FePt nanoparticles produced by the implantation of Fe and Pt ions into single-crystal Al2O3 or fused SiO2 followed by thermal processing. The MFM results are compared to cross-section and plan view transmission electron microscopy images of the same samples. We demonstrate that MFM can detect magnetism in nanosized particles that are situated several hundred nm below the sample surface. MFM is shown to be a promising tool for studying the characteristics of magnetic nanoparticles produced by ion implantation.
Databáze:	OpenAIRE
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