Molecular Sensitivity of Near-Field Vibrational Infrared Imaging
| Autor: | Tefera E. Tesema, Hamed Kookhaee, Bijesh Kafle, Terefe G. Habteyes, Chih-Feng Wang |
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| Rok vydání: | 2020 |
| Předmět: |
Materials science
business.industry Infrared Physics::Optics Near and far field 02 engineering and technology Molecular systems 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials law.invention General Energy Optics Optical microscope law Sensitivity limit Sensitivity (control systems) Physical and Theoretical Chemistry 0210 nano-technology business |
| Zdroj: | The Journal of Physical Chemistry C. 124:21018-21026 |
| ISSN: | 1932-7455 1932-7447 |
| DOI: | 10.1021/acs.jpcc.0c07979 |
| Popis: | Quantifying the sensitivity limit of scattering-type scanning near-field optical microscopy (s-SNOM) in vibrational infrared imaging requires assembly of molecular systems with continuous variation... |
| Databáze: | OpenAIRE |
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