| Autor: |
N. A. Usachev, Vitally A. Telets, G. V. Chukov, V. V. Elesin, A. G. Kuznetsov, D. I. Sotskov, G. N. Nazarova, Dmitry V. Boychenko |
| Rok vydání: |
2015 |
| Předmět: |
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| Zdroj: |
2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS). |
| DOI: |
10.1109/radecs.2015.7365690 |
| Popis: |
This paper presents a brief overview of total ionizing dose effects for a variety of PLL ICs and PLL-based frequency synthesizer implemented in commercial bulk CMOS, silicon-on-insulator CMOS, BiCMOS and SiGe BiCMOS technology processes with frequency range up to 8 GHz. Total dose sensitivity data of PLL ICs have been obtained at the SPELS test center, based on comprehensive parametric and functional control. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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