Texture and Microstructure Imaging by the Moving Area Detector Method
| Autor: | Andrea Preusser, Helmut Klein, Hans Joachim Bunge |
|---|---|
| Rok vydání: | 2005 |
| Předmět: |
010302 applied physics
Materials science business.industry Crystal orientation Microstructure imaging 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Atomic and Molecular Physics and Optics Synchrotron law.invention Optics law 0103 physical sciences Area detector General Materials Science Volume element 0210 nano-technology business |
| Zdroj: | Solid State Phenomena. 105:3-14 |
| ISSN: | 1662-9779 |
| DOI: | 10.4028/www.scientific.net/ssp.105.3 |
| Popis: | Additional to the position of any volume element of a (poly)-crystalline material its crystal orientation must also be known. Both together are described in the six-dimensional orientation-location space. The paper describes the most frequent structures of materials in this space and how these can be imaged with the "Moving Area Detector Method" using hard synchrotron X-rays. This technique is equally well suited for basic reseach in materials science as well as for non-destructive testing of technological parts or even complex structural components. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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