XPS study of NiO Growth on Ag(100)
| Autor: | Shi-Jin Seong, Han-Na Hwang, Soo-Hyon Park, C. C. Hwang, Seolun Yang, Jeong-Gyun Kim, H.G. Min, Young Jun Chang |
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| Rok vydání: | 2007 |
| Předmět: | |
| Zdroj: | Journal of the Korean Vacuum Society. 16:311-321 |
| ISSN: | 1225-8822 |
| Popis: | We have researched the chemical defects of NiO ultrathin films grown on Ag(001) by x-ray photoelectron spectroscopy. In particular, O 1s and Ni 2p spectra were analyzed consistently with control film thickness, partial pressure and substrate temperature. As a result, we could identify each chemical defect. In addition, we suggest the optimum growth condition to minimize the defect density. |
| Databáze: | OpenAIRE |
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