X-ray spectroscopic study of the nature of the oxygen-silicon bond in organosilicon compounds

Autor:	A. T. Shuvaev, T. A. Lyubeznova, B. Yu. Khel'mer, T. L. Krasnova, L. N. Mazalov
Rok vydání:	1984
Předmět:	Inorganic Chemistry chemistry.chemical_compound Silicon Solid-state physics Chemistry Inorganic chemistry Materials Chemistry X-ray chemistry.chemical_element Physical and Theoretical Chemistry Photochemistry Oxygen Organosilicon
Zdroj:	Journal of Structural Chemistry. 25:328-330
ISSN:	1573-8779 0022-4766
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ef0643ffc6e45cfbab9618ca255b23ab https://doi.org/10.1007/bf00747368 Zobrazit plný text záznamu Full text from SpringerLink