Impact of Process Variations on Upset Reversal in a 65 nm Flip-Flop

Autor:	Amy V. Kauppila, Dennis R. Ball, W. Tim Holman, Bharat L. Bhuva, Lloyd W. Massengill
Rok vydání:	2012
Předmět:	Nuclear and High Energy Physics Materials science Nuclear Energy and Engineering Condensed matter physics law Single event upset Electronic engineering Process (computing) lipids (amino acids peptides and proteins) Electrical and Electronic Engineering Flip-flop Upset law.invention
Zdroj:	IEEE Transactions on Nuclear Science. 59:886-892
ISSN:	1558-1578 0018-9499
Popis:	This work postulates a mechanism, upset reversal, and analyzes the impact of process variations on the mechanism. Process variations are shown to affect the onset of upset reversal for a 65 nm flip-flop.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::eee40e49fa193bf8fc962dff387bf154 https://doi.org/10.1109/tns.2012.2196448 Zobrazit plný text záznamu