Nanoscale Mapping of Strain and Composition in Quantum Dots Using Kelvin Probe Force Microscopy
| Autor: | E. Lepkifker, A. Schwarzman, Yossi Paltiel, A. Raizman, Yossi Rosenwaks, S. Shusterman, A. Sher |
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| Rok vydání: | 2007 |
| Předmět: |
Kelvin probe force microscope
Nanostructure Strain (chemistry) business.industry Chemistry Mechanical Engineering Doping Bioengineering Nanotechnology General Chemistry Condensed Matter::Mesoscopic Systems and Quantum Hall Effect Condensed Matter Physics Condensed Matter::Materials Science Quantum dot Microscopy Optoelectronics General Materials Science Work function business Nanoscopic scale |
| Zdroj: | Nano Letters. 7:2089-2093 |
| ISSN: | 1530-6992 1530-6984 |
| Popis: | A key factor in improving quantum dots electrical properties and dots-based devices is the ability to control the crucial parameters of composition, doping, size, and strain distribution of the dots. We show that nanometer-scale work function measurements using ultrahigh vacuum Kelvin probe force microscopy is capable of measuring the strain and composition variations within and around individual QDs. This is accomplished by analyzing the detailed surface potential profiles in and around InSb/GaAs dots. |
| Databáze: | OpenAIRE |
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