Sample-in-waveguide geometry for TXRF sensitivity improvement
| Autor: | Vitaly Panchuk, Andrey Legin, Andrey Grebenyuk, Valentin Semenov, Alexander Goydenko, Dmitry Kirsanov, S. M. Irkaev |
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| Rok vydání: | 2017 |
| Předmět: |
Detection limit
Total internal reflection Materials science Environmental analysis business.industry 010401 analytical chemistry Analytical chemistry 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Sample (graphics) 0104 chemical sciences Analytical Chemistry Planar Optics Waveguide (acoustics) Trace analysis Sensitivity (control systems) 0210 nano-technology business Spectroscopy |
| Zdroj: | Journal of Analytical Atomic Spectrometry. 32:1224-1228 |
| ISSN: | 1364-5544 0267-9477 |
| DOI: | 10.1039/c7ja00096k |
| Popis: | Total reflection X-ray fluorescence (TXRF) is a rapidly developing trace analysis method due to a number of advantages. It is a fast and multielemental method and does not require complex sample pretreatment. Nevertheless, there are certain drawbacks (especially in the environmental analysis) where TXRF sensitivity is not sufficient and employment of various preconcentration methods is required. The present study suggests a very simple procedure based on a planar waveguide technique, where the sample to be analyzed is placed directly into the waveguide. Waveguide construction is also simple and can be produced in any lab using two standard glass reflectors. Such an approach permits considerable improvement of the signal-to-noise ratio in a spectrum and allows for achievement of detection limits for e.g. Cd and Hg at 0.12 μg L−1 and 0.13 μg L−1 respectively. |
| Databáze: | OpenAIRE |
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