Xenon N4,5OO Auger spectrum—a useful calibration source
| Autor: | John D. Bozek, Karoline Wiesner, V. Myrseth, T. D. Thomas, T. X. Carroll, Leif J. Sæthre, Edwin Kukk |
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| Rok vydání: | 2002 |
| Předmět: |
Physics
Auger electron spectroscopy 3D optical data storage Radiation Spectrometer chemistry.chemical_element Electron Condensed Matter Physics Kinetic energy Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Auger Xenon chemistry Calibration Physical and Theoretical Chemistry Atomic physics Nuclear Experiment Spectroscopy |
| Zdroj: | Journal of Electron Spectroscopy and Related Phenomena. 125:127-132 |
| ISSN: | 0368-2048 |
| Popis: | In the xenon N 4,5 OO Auger spectrum there are 19 prominent lines ranging in kinetic energy from 8 to 36 eV that provide a convenient set of standards for calibrating electron spectrometers. Combining optical data with recent measurements of this spectrum gives energies for these lines that are absolutely accurate to 11 meV. For most lines the relative accuracy is better than 1 meV; for a few it is about 3 meV. The spin–orbit splitting of the xenon 4d lines is determined to be 1979.0±0.5 meV. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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