Considerations of Sample Thickness and Detector Placement in Intensity Limited Polychromatic X-Ray Diffraction Experiments

Autor:	J. A. Copley, B. Ellyson, J. Klemm-Toole, J. Gao, N. Kedir, C. Kirk, W. Chen, N. Parab, T. Sun, K. Fezzaa, K. Clarke, A. J. Clarke
Rok vydání:	2022
Předmět:	Mechanics of Materials Materials Science (miscellaneous)
Zdroj:	Journal of Dynamic Behavior of Materials. 8:492-499
ISSN:	2199-7454 2199-7446
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ee1e456fe69d650be8e7554ad0d9cc54 https://doi.org/10.1007/s40870-022-00345-8 Zobrazit plný text záznamu Full text from SpringerLink