Layout-Based Evaluation of Read/Write Performance of SOT-MRAM and SOTFET-RAM

Autor:	Olalekan Afuye, Shady Agwa, Christopher Batten, Alyssa Apsel
Rok vydání:	2021
Zdroj:	ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::edb3c38e8c5e8ab9e9800184e659c0bd https://doi.org/10.1109/essderc53440.2021.9631814 Zobrazit plný text záznamu