Comparison of Weibull small samples using Monte Carlo simulations
| Autor: | Rex Lam, Jan K. Spelt |
|---|---|
| Rok vydání: | 2007 |
| Předmět: |
Computer science
business.industry Design of experiments Monte Carlo method Management Science and Operations Research Sample size determination Likelihood-ratio test Statistics Econometrics Microelectronics Safety Risk Reliability and Quality business Reliability (statistics) Type I and type II errors Weibull distribution |
| Zdroj: | Quality and Reliability Engineering International. 23:503-513 |
| ISSN: | 1099-1638 0748-8017 |
| Popis: | The evaluation of the functional reliability of different designs is a common task and times to failure can be compared using the likelihood ratio test. In the microelectronics industry, as in many others, the high cost of testing places severe restrictions on the sample size. Moreover, the products in these tests are often new and do not have previous reliability histories. These factors make the selection of the Type I and Type II errors in comparison tests very difficult. This paper presents the Monte Carlo simulation results of Type II errors for the likelihood ratio test of comparison as a function of the Type I error and the (small) sample size. Our conclusions are summarized as follows: (1) the common microelectronics industry standard sample size of 32 is often insufficient to reach satisfactory conclusions; (2) small sample tests should only be used for prescreening for significant differences; and (3) when only small samples are available, the Type I and the Type II errors must be selected carefully to prevent misleading conclusions. Copyright © 2006 John Wiley & Sons, Ltd. |
| Databáze: | OpenAIRE |
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