Update on parts SEE suspectibility from heavy ions

Autor:	W.R. Crain, D. K. Nichols, K. Watson, S.J. Hansel, H.R. Schwartz, G. A. Soli, R. Koga, L. S. Smith, K.B. Crawford, D. D. Lau
Rok vydání:	1991
Předmět:	Physics Nuclear and High Energy Physics business.industry Electrical engineering Table (information) Jet propulsion Set (abstract data type) Nuclear Energy and Engineering CMOS Heavy ion Electrical and Electronic Engineering business Aerospace Test data
Zdroj:	IEEE Transactions on Nuclear Science. 38:1529-1539
ISSN:	1558-1578 0018-9499
DOI:	10.1109/23.124142
Popis:	Jet Propulsion Laboratory (JPL) and the Aerospace Corporation have collected a fourth set of heavy ion single event effects (SEE) test data (previous sets were reported in contribution IEEE Trans. on Nuclear Sci. in December 1985, 1987, and 1989). Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are displayed. All data are conveniently divided into two tables: one for MOS devices, and one for a shorter list of recently tested bipolar devices. In addition, a new table of data for latchup tests only (invariably CMOS processes) is given. >
Databáze:	OpenAIRE
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