Preliminary ellipsometric studies and tests for measuring the birefringence of electro-optic materials

Autor:	Raluca Műller, Valentin Ion, Cristian Udrea, Petre Cătălin Logofătu, N.D. Scarisoreanu
Rok vydání:	2010
Předmět:	chemistry.chemical_compound Materials science Birefringence Optics chemistry Uniaxial crystal Ellipsometry business.industry Perpendicular Strontium barium niobate Thin film business Symmetry (physics)
Zdroj:	SPIE Proceedings.
ISSN:	0277-786X
DOI:	10.1117/12.882140
Popis:	Ellipsometry is a convenient means to ascertain electro-optic properties, and the null-type methods are particularly so because they do not require a powermeter. Electro-optic materials like Strontium Barium Niobate (SBN) with the symmetry axis normal or parallel to the surface are materials suitable for thin film integrated optic devices, therefore of practical interest. For this reason we endeavoured to devise and to test experimental arrangements that measure the birefringence of uniaxial structures with the symmetry axis parallel and perpendicular to the surface.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ed6de7f50f927c5b68b12194d82862a2 https://doi.org/10.1117/12.882140 Zobrazit plný text záznamu